Measurement of the cross section and T distribution in diffractive deep inelastic scattering at HERA
TP1, TP2, and TP3 are internal probe points on the chip. time is r, = 32ns and the overall gain is about 150mV/ fC. ... No reset is required and the dead time is of the order of 150ns. ... was realised in radiation 3The threshold is typically at 4 sigma above the rms noise level. hard \.2\xm CMOS technology by UTMC, California.
| Title | : | Measurement of the cross section and T distribution in diffractive deep inelastic scattering at HERA |
| Author | : | Emanuela Barberis |
| Publisher | : | - 1996 |
You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.
Once you have finished the sign-up process, you will be redirected to your download Book page.
How it works:- 1. Register a free 1 month Trial Account.
- 2. Download as many books as you like (Personal use)
- 3. Cancel the membership at any time if not satisfied.
